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Contenido

The comprehensive guide to analog and mixed-signal IC testing. Increasingly, ICs contain both analog and digital circuitry, making the testing process extremely challenging. This comprehensive guide reviews all the potential testing options for analog and mixed-signal ICs, enabling designers, engineers, CAD developers and researchers to choose the most cost-effective, accurate solution. It outlines the state-of-the-art in analog testing, and covers both major alternatives in-depth: specification-based test and fault model-based test. Includes contributions from leading researchers worldwide Provides comprehensive references for further research Fault modeling, fault simulation and test generation techniques Extensive coverage of design-for-test techniques Best methods for spectral-based built-in self test Understand which digital testing techniques and algorithms are applicable to analog and mixed-signal circuitry, and which must be modified. Review fault modeling in detail, especially inductive fault analysis. Learn how to implement the 1194.4 Standard Mixed-Signal Test Bus, understanding its test functions, capabilities, potential

benefits and costs. Finally, take a careful look at the testing and design issues associated with CMOS switched-current circuits. Analog and Mixed-Signal Test is the essential tutorial and reference for all electrical engineers designing or testing circuits and devices with analog components.

   CONTENIDO: Preface. Contributors. 1. Introduction. Motivation. History. Current Research. Influence of Digital Test. Analog Test Issues. Test Paradigms. Organization. Conclusion. 2. Defect-Oriented Testing. Introduction. Previous Work. Estimation Method. Topological Method. Taxonomical Method. Defect-Based Realistic Fault Dictionary.

Implementation. A Case Study. Fault Matrix Generation. Stimuli Matrix. Simulation Results. Silicon Results. Observations and Analysis. IFA-based Fault Grading and DFT for Analog Circuits. A/D Converter Testing. Description of the Experiment. Fault Simulation Issues. Fault Simulation Results. Analysis...

Detalles del artículo

• Páginas : 256
• Editorial : Prentice Hall
• Idioma : Inglés
• Fecha de Publicación : 01/01/1998
• ISBN: 9780137863105
• Encuadernación : Tela
• Nº Volúmenes : 1
• Nº Edición : 4