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• Kirkland, Earl J. - Advanced computing in electron microscopy.

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Contenido

This book provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help interpret and understand high resolution information in recorded electron micrographs. This revised edition contains new sections on recent instrumental developments and updated references. It should be useful for beginning and experienced users at the advanced undergraduate or graduate level. This new edition will be a revision of the existing text, including new developments in this field since the original manuscript and updated references. Additional material will include abberration corrected instruments and confocal electron microscopy. The references and examples will be improved and expanded and some sections polished to improve ease of understanding. This book features numerical computation of electron microscopy images as well as multislice methods High resolution CTEM and STEM image interpretation are included in the text This newly updated second edition will bring the reader up to date on new developments in the field since the 1990's The only book that specifically addresses computer simulation methods in electron microscopy

   INDICE: Introduction.- The transmission electron microscope.- Linear imageapprox.- Sampling and the fast fourier transform.- Calculating images of thin specimens.- Calculating images of thick specimens.- Some worked examples.- Program details.- App. A: Atomic potentials and scattering factors.- App. B: The fourier projection theorem.- App. C: Bilinear interpolation.- App. D: 3D perspective view.

Detalles del artículo

• Páginas : 289
• Editorial : Springer
• Idioma : Inglés
• Fecha de Publicación : 29/08/2010
• ISBN: 9781441965325
• Encuadernación : Cartoné
• Nº Volúmenes : 1
• Nº Edición : 2
• País de Publicación : Estados Unidos
• Lugar de Publicación : New York